YieldingSpeedyProgression
YieldingSpeedyProgression
UnlocktheFullPotentialofAIwithCutting-EdgeTesting
UnlocktheFullPotentialofAIwithCutting-EdgeTesting
SustainablePowerTestingFromWastetoWatts
SustainablePowerTestingFromWastetoWatts
ESG．NetZero．Sustainability
ESG．NetZero．Sustainability

At Chroma
We Advance Excellence

Our leading-edge solutions catalyze breakthroughs across tech industries, setting new benchmarks for quality and reliability. Partner with us in empowering future technologies for a better world.

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Test Solutions

PowerElectronicsTestSolutions
Power Electronics Test Solutions
ElectricVehicleTestSolutions
Electric Vehicle Test Solutions
BatteryTest&AutomationSolutions
Battery Test & Automation Solutions
EnergyStorageSystem(ESS)andPowerConversionSystem(PCS)TestSolution
Energy Storage System (ESS) and Power Conversion System (PCS) Test Solution
PassiveComponentTestSolutions
Passive Component Test Solutions
ElectricalSafetyTestSolutions
Electrical Safety Test Solutions
Video&ColorTestSolutions
Video & Color Test Solutions
FPD(FlatPanelDisplay)TestSolutions
FPD (Flat Panel Display) Test Solutions
LED&DriverTestSolutions
LED & Driver Test Solutions
PhotonicsTestSolutions
Photonics Test Solutions
Photovoltaic/InverterTest&AutomationSolutions
Photovoltaic / Inverter Test & Automation Solutions
Semiconductor/ICTestSolutions
Semiconductor/IC Test Solutions
PXITest&MeasurementSolutions
PXI Test & Measurement Solutions
OtherSolution&Services
Other Solution & Services
solution

Newsroom

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26 Sep 2024

Chroma Launches New 3650-S2 Function Module: Revolutionizing Third-Generation Semiconductor Avalanche Testing

Chroma has officially launched a new UIS (Unclamped Inductive Switching) function module for its 3650 series test systems. Specifically designed for avalanche testing, this module is particularly suitable for third-generation semiconductor materials such

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06 Sep 2024

Ultra-Low Voltage DC Load 0.25V@2000A - Suitable for CPU & GPU VCORE Power Supply Test

Generative AI is developing at a rapid pace, showcasing increasingly impressive capabilities in diverse areas from voice and image generation to medical imaging. As these technologies require massive amounts of complex and real-time computation, the serve

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12 Jul 2023

Chroma ATE Wins Six Awards in II Research 2023 Asia Pacific Executive Team Survey

Institutional Investor Research(II Research), a premier research and ranking institution in the global investment community, recently announced the results of its Institutional Investor 2023 Asia Executive Team Survey. 6,474 investors, fund managers, and

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11 Aug 2023

Chroma ATE Inc. Featured in Forbes Asia's Best Under A Billion 2023

Chroma ATE Inc. has been recognized on Forbes Asia's highly esteemed Best Under A Billion list for 2023! This achievement underscores our company's exceptional performance in the Asia-Pacific region, demonstrating resilience and growth in the face of glob

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Events

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Electronica2024

Electronica 2024

  • Date: 2024.Nov.12 – 2024.Nov.15
  • Venue:Messe Munchen, Munchen, Germany
  • Booth:A3-230

Blog

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ReliabilityTestingandBurn-inOptimizationforSemiconductorLasersandOptoelectronics Webinar

Reliability Testing and Burn-in Optimization for Semiconductor Lasers and Optoelectronics

Jul-16-2024
Semiconductor Photonics
In this webinar, you'll learn about the methodology for reliability qualification and optimizing burn-in. You'll also learn about the range of reliability and burn-in hardware on the market, and newly available reliability-test-as-a-service options.

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ChallengesofDCEVSEProductionLineTesting Feature Story

Challenges of DC EVSE Production Line Testing

Nov-24-2023
Power Electronics EV Battery
Designs of ESVEs (Electric Vehicle Supply Equipment) are complicated by the industries' inability to standardize which is resulting in different charging interfaces and power levels depending on car type and location of charging stations.

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