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Chroma has officially launched a new UIS (Unclamped Inductive Switching) function module for its 3650 series test systems. Specifically designed for avalanche testing, this module is particularly suitable for third-generation semiconductor materials such
moreGenerative AI is developing at a rapid pace, showcasing increasingly impressive capabilities in diverse areas from voice and image generation to medical imaging. As these technologies require massive amounts of complex and real-time computation, the serve
moreInstitutional Investor Research(II Research), a premier research and ranking institution in the global investment community, recently announced the results of its Institutional Investor 2023 Asia Executive Team Survey. 6,474 investors, fund managers, and
moreChroma 58604 Photonic IC Burn-in and Reliability Test System has been honored with the 2024 TOSIA Award for Outstanding Product. Presented by the Taiwan Optoelectronic and Semiconductor Industry Association (TOSIA), this award recognizes products for thei
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