Reliability Testing and Burn-in Optimization for Semiconductor Lasers and Optoelectronics

Jul-16-2024

半導體 光子學

Laser reliability has been a key to new product qualification for data communications products, and many other upcoming applications, including powering AI clusters, cloud data centers, and LIDAR for autonomous driving. After starting with a case study, we will talk about the process of reliability qualification, where the reliability risk usually lies, and potential test platforms. Typical reasons for device failure will also be covered. Then we will cover the different reliability test hardware on the market for both engineering qualification and high-volume burn-in. Different supported form-factors will be detailed. We will close with the introduction of new【reliability-test-as-a-service】and outsourced burn-in options, and the chance to ask questions about laser reliability and reliability testing methods.

Dr. Robert W. Herrick 
Consultant 
Robert Herrick Consulting 

John R. Tessitore 
Vice President of Sales and Marketing 
Chroma ATE Inc.

Leo Lu 
Sales Manager 
Testar 

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