Semiconductor manufacturing is a fast-moving industry. While devices become increasingly integrated and multi-functional, capital equipment must be built to endure through several device generations and applications. With an array of available options such as AD-DA converter test, ALPG for memory test, high-voltage PE, multi-scan chain test, VI45, PVI100 & MPVI analog test, and ASO & HDADDA mixed-signal test, the Chroma 3650 provides wide coverage and flexible configurations for many device types.

The Chroma 3650 is an SoC test system with high throughput and high parallel test capabilities, providing the most cost-effective solution for fabless, IDM, and testing houses. With a complete range of test functions, high accuracy, powerful software tools, and excellent reliability, Chroma 3650 is the test solution for all your high-performance microcontroller, analog IC, consumer SoC device, and wafer sort applications.

The Chroma 3650 brings down cost of test, not only by lowering the overall system's cost but also by delivering higher throughput and increased parallel test capability. Equipped with Chroma's advanced PINF IC and a sophisticated calibration system, the 3650 delivers exceptional timing accuracy within ±550ps. The pattern generator of the 3650 features up to 32M pattern instruction memory. This extensive memory depth matches the depth of the vector memory, allowing for pattern instructions to be added for each test vector.

The system's powerful sequential pattern generator provides a variety of pattern commands to meet the demands of complex test vectors. The true test-per-pin architecture and flexible site mapping with no slot boundaries are designed for multi-site test with high throughput. With up to 640 digital pins, 32 device power supplies, per-pin PMU and analog test capability, the 3650 delivers a combination of excellent test performance and throughput in a cost-effective test solution.

The 3650's powerful and versatile parallel pin electronics excel at simultaneously executing identical parametric tests on multiple pins. Each LPC board houses 64 digital pins driven by 16 high-performance Chroma PINF ICs, each supporting 4 timing generator channels. Integrated local controller circuitry streamlines resource management and result readout, minimizing the overhead of the system controller. With its flexible any-pin-to-any-site mapping design, the 3650 enables high-throughput parallel testing on up to 32 sites, optimizing mass production efficiency and simplifying layout.

▲ 64-Channel Digital Pin Card

The semiconductor industry is a fast moving one, and capital equipment must be built to outlive several device generations and applications. With a broad range of available options, such as AD-DA converter test, ALPG for memory test, high voltage PE, multiple scan chain test, and VI45 & PVI100 & MPVI analog options, Chroma 3650 makes sure that it will serve you for years to come.

Moreover, the Chroma 3650's platform architecture allows development of specialized instruments by third-party suppliers that can be easily added for specific applications. It can stretch the boundaries of test by covering a broader range of devices than ever before possible in a low-cost production test system.

▲ CP Docking Solution for other Tester Platform

The 3650 features an air-cooled, compact tester-in-a-test-head design, delivering excellent throughput in a highly integrated package taking up minimal floor space. The mainframe cabinet houses the power distribution units and provides space for third-party instruments. With the optional manipulator, the 3650 can be utilized for both package and wafer test.

The 3650 comes equipped with the powerful Chroma Integrated Software Platform (CRISP), offering a comprehensive suite of tools for rapid test development, debugging, production, and data analysis. CRISP integrates functions for test development, execution control, data analysis, and tester management into a single platform. Built on the Microsoft Windows OS and utilizing C++, CRISP provides a robust, intuitive, and fast-runtime graphical user interface (GUI) for all testing needs. Within the Project IDE tool, test developers can easily switch between standard templates, user-defined templates, and a C++ code-based editor to quickly create test programs that can automatically scale to multi-site parallel testing. CRISP also includes test program and test pattern converters to facilitate the migration of test programs from other platforms to the 3650.

For test program execution, users can choose between the System Control tool for normal operation and the Plan Debugger tool for debugging mode. The Plan Debugger tool provides settings such as breakpoints, step, step-into, step-over, pause and resume, variable-watch, variable-modify, enabling precise control over the test program. CRISP also provides a rich set of utilities for debugging and data analysis. The Datalog, Waveform, and Scope tools support display of measured data and digital waveforms. The SHMOO and Pin Margin tools enable easy parametric margin debugging through both automatic and manual modes. The Wafer Map, Summary, Histogram, and STDF tools are invaluable for collecting and analyzing test results and parametric characterizations.

For run-time debugging, the Test Condition Monitor and Pattern Editor offer advanced capabilities enabling users to change test conditions or pattern data without interrupting the test or modifying source files. CRISP also includes the ADDA tool and Bit Map tool for the analog and ALPG options, allowing users to visualize AD-DA test results and easily create ADC patterns. This comprehensive suite of GUI tools is designed to meet diverse needs in test debugging and reporting.

The OCI tool is CRISP's solution for mass production. This user-friendly interface simplifies operations for production personnel and minimizes human error. After using the Production Setup tool to tailor the OCI tool to the specific requirements of the production environment, operators can simply select the pre-planned process and start the production run.

The 3650 offers extensive compatibility with handlers and probers through both the GPIB and TTL interfaces. It supports a wide range of industry-standard equipment from manufacturers such as SEIKO-EPSON, SHIBASOKU, MULTITEST, ASECO, DAYMARC, TEL, TSK, and OPUS II, among others. In addition to providing convenient converter tools for test platform migration, the 3650 also provides an adapter board solution that allows it to interface with existing tester platforms. This enables the 3650 to directly accept DIBs and probe cards from other testers, eliminating the cost of developing new load boards and probe cards.

Chroma provides comprehensive application support tailored to meet the needs of both new and established customers. Whether you're looking to accelerate ramp-up, capitalize on emerging market opportunities, enhance productivity, or lower cost of test through innovative strategies, our global customer support team is dedicated to delivering timely and effective solutions designed around your unique requirements.