The Chroma 58604C is a high-density, multifunctional module-based system for laser diode burn-in and lifetime testing. Each module has 256 SMU channels that can source current and measure voltage or source voltage and measure current in various control modes. The system can accommodate 7 modules for a total of 1,792 SMU channels.

In auto current control (ACC) mode, the control circuit will source a preset current to each laser diode with high stability. The current will remain constant during the burnin process, even as device resistance and temperature fluctuate. The operating voltage is recorded as a quality reference parameter.

Each module can be individually configured with different test conditions, including control mode (ACC/AVC), start time and test duration. This modular design greatly enhances the system's versatility by allowing different modules to test different devices under test (DUT) simultaneously without electrical interference.

The control circuit is specially designed to protect each laser diode, ensuring no in-rush current or voltage will damage the DUT. Upper and lower limits of current and voltage can be set to trigger auto shutdown protection. When any abnormality occurs, only the relevant channels are shut down while other channels remain operational. To ensure comprehensive DUT safety, ESD protection is also retained in the system design.

Measurement data is stored in the system IPC and optionally on a remote server. If communication between the module and the IPC is temporarily lost, data will be buffered in the module for at least 72 hours based on 3-minute sampling rate. After communication is restored, the buffered data will be losslessly uploaded to the IPC/server.