In order to cope with the IC testing trend of highspeed, numerous pins and complex functions in the future, the newest generation of Chroma's VLSI testers, 3380D/3380P/3380, have adopted a more flexible architecture with higher integration density and powerful functions.
The 3380D/3380P/3380 test systems have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
The test systems also have built in DC power rack design to provide a small footprint/clear power ATE to become a very competitive price/performance ratio test system.
The 3380D will be ideally for IoT applications, especially for those cost sensitive devices such as MCU, MEMS, and MCU with integrated functions. The VLSI test systems, including the 3380D/3380P/3380 series, have been widely adopted in China market.
Full Applications to meet veried ICs
Such as Logic, ADDA, RF(MCU), LED, Power, ALPG, Match, etc.
