To cope with the IC testing trend of highspeed, numerous pins, and integration of complicated functions in nowadays semiconductor industry, Chroma's 3380 VLSI Test Systems, the 3380D/3380P/3380 models, have adopted powerful functions according to different pin counts and parallel test ability, providing a complete test solution to fulfill customer's demands in cost and performance.
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexible architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-site test tendency. The embedded 1024 I/O pins is capable of testing 1024 ICs in parallel. In addition to supporting the unique 4-wire HD VI source ICs, the 3380 can also test Mini & Micro LED driver IC, CMOS image sensor(CIS), and 3D images through its adjustable structure, which covers a wide range of applications for IC testing.
The 3380 can bridge to 3380D(256 pins) /3380P(512 pins)for higher productivity requirements. No matter it is installation, stability, friendly user interface, or high cost/ performance ratio, the 3380 Series VLSI test systems have been widely proven and adopted by Great China market.
Applications
- MCU device
- ADC/DAC mixed-signal IC
- Logic IC
- ADDA
- ALPG
- Smart card
- CMOS image sensor (CIS)
- Power IC (Class D IC)
- Consumer IC
- LED driver IC
