Behind Every AI Chipset Design, Power Density, and Optical Fiber Breakthrough
In the ever-evolving semiconductor industry, adaptability is key. At Chroma, we understand that the industry’s needs shift like the sands of time. That’s why our diverse solutions are designed to address your testing challenges at every stage and every turn.
Test Applications in AI Advanced Packaging
Chroma 7980 and 7981 are designed for precise and nanoscale 2D/3D measurement of critical dimensions (CD). Powered by Chroma's patented measurement integration technology BLiSTM, these systems achieve sub-nanometer resolution. 7980 and 7981 provide algorithms and UI developed specifically for advanced packaging applications, integrating specially designed platforms to achieve high-speed measurement and rapid auto-focus, non-contact surface profile analysis; they also feature large-area stitching capability to meet various application needs. Already successfully adopted by various industry-leading customers, Chroma 7980 and 7981 offer a proven solution for applications such as TSV/VIA, RDL, Probe Mark, Overlay, Sub-μm, Surface Profile, and more.
2D/3D Wafer Metrology System 7980/7981↗
Test Applications in AI / HPC Chips
For power-hungry operations in AI server and high-performance computing (HPC) applications such as compute, networking, and storage, cutting-edge cooling is becoming ever-more imperative. Chroma's 31000R series temperature forcing system, specifically designed to cater to high-power consumption ICs in AI and HPC, provides a robust solution with a power dissipation capability of up to 1,800 watts. Chroma is actively developing solutions to meet evolving market demands for high heat dissipation for AI servers and HPC, where hardware foundations are constantly shifting.
The Chroma A310002 Ultra-Low-Temperature Test System offers a stable Tri-Temp test temperature range of -70 to 150 °C and a power dissipation capacity of up to 1,000W, ideal for a range of rigorous temperature tests. Combined with the Chroma 3200 Versatile SLT Test Platform, it provides a multi-station SLT test platform for use in production lines, and can be paired with the CVOT (Chroma Virtual Operation Tools) software tool for easy access to production information and yield optimization. Chroma's ultra-low temperature test solution can meet the needs of industries such as automotive semiconductor ICs, AI and data centers, graphics processors (GPU), accelerated processing units (APU), high-performance computing (HPC), aerospace, and defense. Designed to ensure that chips can operate without issues in harsh environments, this is an optimal choice for product reliability testing.
Test Applications in Vcore Power Supply
Our ultra-low-voltage DC electronic loads deliver a meticulously controlled voltage supply tailored for CPUs and GPUs. With an outstanding minimum operating voltage of 0.25V and a max rated current of 2,000A, these loads have the capability to load current all the way down to the 0.25V-0V range. The unique front copper busbar design provides low inductance connections, enabling industry-leading slew rates and minimizing IR voltage drops due to cable resistance. These loads’ high precision at ultra-low voltages ensures reliability while adequately addressing the nuanced requirements of AI chips.
Chroma Ultra-Low-Voltage DC Electronic Load 63202A-20-2000↗
Test Applications in Optical Fiber Communication
As silicon photonics technology continues to evolve, Chroma ensures customer success by aiding in the development of innovative technology products while maintaining performance and quality standards. Chroma 58604 Photonic IC Burn-in and Reliability Test System offers aging, reliability, and lifetime testing for a variety of photonic chip components such as laser diodes (LDs), photodiodes (PDs), and optical modulators. The system boasts a testing capacity of up to 1,792 channels with 28 independent temperature control modules, each providing bi-polar voltage and current outputs and measurements across 64 SMU channels.
Chroma Laser Diode Burn-in and Reliability Test System 58604↗
Chroma Laser Diode Characterization System 58620 ↗
Chroma VCSEL Wafer Test System 58635↗
Test Applications in Data Storage—Hard Disk Drive (Laser Diode for HAMR Technology)
Chroma 58212-C is an automated Epitaxial Wafer/Chip probe test system with precision temperature-control that provides fast and accurate optoelectronic performance measurements and multi-site tests for a wide range of Photodiode for HAMR (Heat-Assisted Magnetic Recording) and Laser Diode product applications. The pretest scan program provides complete wafer mapping to ensure test accuracy, while our patented probe tip prevents scratching of the DUT and ensures that every chip contact is made properly.
Chroma Photonics Device Mapping Probe Tester 58212-C↗
Empower your AI innovations with Chroma, your partner in Advancing Excellence and unlocking the full potential of AI chipset design, power density, and optical fiber communication.
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