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Gallery View List View Package Level Test High Channel Density Burn-in TesterModel 58604-C Use with chamber or oven for burn-in, reliability and life test Auto Current Control (ACC), and Auto Voltage Control (AVC) modes Modular design for easy customization and maintenance Comprehensive ESD protection Independent channels for source and measurement Add to Inquiry Cart Laser Diode Burn-in and Reliability Test SystemModel 58604 Applicable for burn-in, reliability andlife testing ACC and APC burn-in modes Individual channel driving and measurement. Up to 500mA per channel or parallel up Precise temperature control up to 125°C Independent module operation Add to Inquiry Cart High Power Laser Diode Burn-In and Reliability Test SystemModel 58605 Burn-in, reliability and life test ACC and APC control modes Independent channel for source and measurement Spike-Free sourcing Up to 6000 mA per channel and pulsing Add to Inquiry Cart Photodiode Burn-in and Reliability Test SystemModel 58606 Burn-in, reliability and life test Dark Current and Breakdown Voltage 256 channels Bi-polar device source per drawer High bias source to 80 volts Add to Inquiry Cart Laser Diode Characterization SystemModel 58620 Full turnkey automated test for edge-emitting laser diodes High precision and large capacity carrier, interchangeable with other automated equipment Fully automated alignment for fiber-coupled tests Add to Inquiry Cart
Gallery View List View Package Level Test High Channel Density Burn-in TesterModel 58604-C Use with chamber or oven for burn-in, reliability and life test Auto Current Control (ACC), and Auto Voltage Control (AVC) modes Modular design for easy customization and maintenance Comprehensive ESD protection Independent channels for source and measurement Add to Inquiry Cart Laser Diode Burn-in and Reliability Test SystemModel 58604 Applicable for burn-in, reliability andlife testing ACC and APC burn-in modes Individual channel driving and measurement. Up to 500mA per channel or parallel up Precise temperature control up to 125°C Independent module operation Add to Inquiry Cart High Power Laser Diode Burn-In and Reliability Test SystemModel 58605 Burn-in, reliability and life test ACC and APC control modes Independent channel for source and measurement Spike-Free sourcing Up to 6000 mA per channel and pulsing Add to Inquiry Cart Photodiode Burn-in and Reliability Test SystemModel 58606 Burn-in, reliability and life test Dark Current and Breakdown Voltage 256 channels Bi-polar device source per drawer High bias source to 80 volts Add to Inquiry Cart Laser Diode Characterization SystemModel 58620 Full turnkey automated test for edge-emitting laser diodes High precision and large capacity carrier, interchangeable with other automated equipment Fully automated alignment for fiber-coupled tests Add to Inquiry Cart