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Wafer Level Test
In-process Wafer Inspection System
Model 7945
- Double side inspection (post-diced wafer)
- Full color defect detection
- Fast multi-computer image processing
- Shared auto wafer loader
Short Pulse Photonics Device Probing Test System
Model 58636 Series
- Nanosecond-scale pulse driving and measurement
- Drive heterogeneous integration samples like VoS (VCSEL on Silicon), and VoD (VCSEL on Driver) with digital control
- Patented two-in-one optical head design fetches all LIV (Light-Current-Voltage), wavelength, and near-field optics analysis data in one touchdown
- Multi-site and multi-die support enhance test efficiency
Photonics Wafer Probing Test System
Model 58635 Series
- Up to 6" wafer
- Support both QCW and CW operation
- LIV test, Near Field test, Far Field test, LIV-λ & NF two-in-one test
Wafer Chip Inspection System
Model 7940
- Simultaneous double side color inspection
- 6" wafer/8" inspection area
- Automatic wafer alignment
- Wafer shape/edge identification
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