-
SubscriptionSubscription
We will irregular release Chroma solutions, technics, exhibitions, seminar and webinar news. Subscribe today to get more information.
-
0Inquiry Cart
Quick Menu
Chroma's IC test and handler solutions assure that the IC packaging meets the original design specifications and verify the performance of the IC before it is assembled in the electronic product. The pick-and-place IC handler can be used in the system-level test and final test for all sorts of ICs. Working with a tri-temp controller enables simulation of use in a harsh environment under extremely low and high temperatures. Combined with various automated designs, Chroma's IC handler can meet all your testing needs. Chroma Virtual Operation Tools can remotely monitor the test process, predict the handler's test efficiency through big data, and improve your product's test yield.
IC Pick & Place Handler
Single Site Test Handler
Model 3210
- SLT handler
- Ideal for early device design and engineering validation
- Compatible kit to scale-up production
- ATC Tri-temp -40℃ to 150℃ IC test
Hybrid Single Site Test Handler
Model 3110
- FT and SLT compatible handler
- Compatible kit to scale-up production
- ATC Tri-temp -40 to 150 ℃ IC test (Optional -55 to 150℃ , -70 to 150℃)
- Auto tray loading/unloading and device sorting capability
Full Range Active Thermal Control Handler
Model 3110-FT
- Temperature Test from -40~125℃
- Final Test or System Level Test
- 3x3mm~45x45mm Package
Tabletop Single Site Test Handler
Model 3111
- Tabletop design for smaller table space 60 cm2
- (2) Fixed JEDEC trays
- IC package size ranges: 5x5mm to 45x45mm
- Software configurable binning
RF Solution Integrated Handler
Model 3240-Q
Die Test Handler
Model 3112
- Reliable Pick&Place bare die test handler
- Multi-plate input and automated test sorting capability
- Omni-directional adjustable probe stage (X/Y/Z/θ)
- Stage remain die check function
Tri-Temp Octal Sites Handler
3160-C
- Advance thermal technology (Nitro TEC)
- Faster index time 0.6 sec
- Active thermal control and full range temperature
- Chamber less design
Octal Site Test Handler
Model 3180
- Up to x8 parallel test sites
- Up to 9000 UPH
- Temperature test from ambient ~150℃
Automatic System Function Tester
Model 3240
- Innovative handler for high volume/multi-site IC testing at system level.
- Test up to 4 devices in parallel at high temperature with ATC ranging from 50°C to 125°C.
Automatic System Function Tester
Model 3260
- Innovative handler for high volume/multi-site IC testing at system level.
- Test up to 6 devices in parallel at high temperature with ATC ranging from -40°C to 125°C.
Miniature IC Handler
Model 3270
Temperature Forcing System
Model 31000R Series
- -70°C to 150°C temperature range
- Cost competitive
- Compact footprint
- Semi-automation
- Liquid-free Operation
- ↑