Semiconductor testing plays a crucial role in the supply chain, with industry players prioritizing factors such as test speed, cost, signal measurement accuracy, one-stop test capabilities, and software support. Chroma ATE holds a key position in the global ATE (Automated Test Equipment) market, offering a diverse range of solutions and maintaining a strong global presence. Recently, the company hosted a Semiconductor Test Equipment User Conference in Hsinchu, Taiwan, where it shared its 2025 hardware and software test solution roadmap with customers.
Commitment to Growth with Customers: A Comprehensive Solution Blueprint for Global Expansion
George Chang, president of Chroma ATE's Semiconductor Test Business Unit, highlighted in his opening speech that Chroma has been engaged in the semiconductor sector for over 20 years. With an installed base of more than 4,300 test systems worldwide, the company serves markets across Asia, Europe, and the Americas. Chroma's product lines can be categorized into five segments: digital, analog, mixed-signal, interface solutions, and software. The company is also actively developing next-generation products for applications in RF, power, and audio testing.
▲George Chang, president of Chroma ATE's Semiconductor Test BU, stated that as of November 2024,
Chroma's global installed base of semiconductor ATE exceeds 4,300 systems
Focusing on Hardware Test Platforms with Wide Range of Test Boards to Meet Diverse Needs
For wireless solutions, Roger Huang, vice director of the Application Engineering Department at Chroma Group subsidiary Adivic Technology Co., introduced the Chroma 3680 HDRF2 test board. Huang noted that the Chroma 3680 platform natively supports testing of a wide range of chips, but when combined with the HDRF2, it can meet extensive wireless and RF (radio frequency) testing needs, including Wi-Fi 6, BT 5.0/BLE, GPS, and wide-area IoT technologies. Chroma is already developing its successor model, the HDRF3, to address standards such as Wi-Fi 6E/7 and 5G FR1. The company has also developed solutions specifically tailored for the 5G mmWave spectrum. The 30GHz range is addressed by the existing Chroma 3680 HDRF2, while the 48GHz range is supported by the MP5808 model paired with the mmWaveBox, catering to 5G FR2, FR3, and low-earth orbit (LEO) satellite applications.
For power-related chip testing, Spancer Lee, senior manager of Product Marketing at Chroma's Semiconductor Test BU, highlighted the pivotal role of the Chroma 3650 platform. Lee noted that since launching the 3650 platform back in 2002, Chroma has continuously evolved its solutions to meet market demands for power management. The company introduced various test boards and solutions to complement the 3650, culminating in the release of its successor, the Chroma 3650-S2, in late 2022. Chroma is also preparing to unveil a new product, the HTMU board, further demonstrating its commitment to addressing diverse voltage and current combinations for power chip testing. The testing needs of third-generation semiconductors with high-voltage specifications can be effectively met by stacking Chroma's HVVI boards.
Lee also mentioned that as the design of power chips becomes more complex and the manufacturing process evolves, the timing information and related parameters to be measured for power chips become more challenging. Chroma ATE launched these test boards, together with the Chroma 3650-S2, to meet the testing needs of the new generation of power chips.
In the mixed-signal domain, Blair Fan, associate product manager at Chroma's Semiconductor Test BU, focused on the company's roadmap for audio mixed-signal solutions. Fan pointed out that the Bluetooth headset and speaker market is expected to grow at a compound annual growth rate (CAGR) of approximately 20% from 2024 to 2029, reaching a total market value of $38.2 billion. From a product design perspective, challenges in Bluetooth and audio applications include the integration of digital and analog testing, as well as cost control to maintain chip profitability. Chroma addresses these challenges with the Chroma 3380 platform paired with the MXADO module board.
Minimizing Platform Conversion Time Using Large Language Models (LLMs)
Beyond hardware, Chroma has also made significant strides in software solutions. Ray Hsu, software engineer at Chroma's Semiconductor Test BU, explained that in the long run, semiconductor manufacturers will inevitably transition between test platforms. This process typically requires around 140 hours of additional software migration time. However, Chroma leverages Large Language Models (LLMs) to reduce this to just 5 hours. He further explained that the conversion process involves two stages: the first uses LLMs for processing, and the second uses Retrieval-Augmented Generation (RAG) technology. Parameter adjustments and removal of unnecessary parameters are still required to ensure ideal conversion results. Hsu emphasized that while conversion is not 100% perfect and still requires manual refinement, it saves substantial amounts of time compared to traditional methods, which is of great benefit to customers.
In addition to introducing its next generation of semiconductor test solutions, Chroma invited strategic partners Dr. Chen Wei-yang from TMY Technology and Mr. Tai Yu-che of the R&D and simulation department at Keystone Microtech, to share relevant insights on their collaborative advancements.
To sum up, Chroma ATE offers a diverse range of solutions covering digital, analog, and mixed-signal testing in the global ATE market. At the recent user conference held in Hsinchu, Chroma unveiled its 2025 roadmap for hardware and software solutions. The company showcased an array of test equipment including the Chroma 3650, 3680, and the newly launched HDRF series, catering to power management, high-frequency testing, and wireless technology applications.
Amid evolving US-China trade dynamics, Chroma is deepening its localized services while utilizing AI technologies like LLM and RAG to shorten software migration times and enhance testing efficiency. Looking ahead, Chroma ATE is poised to continue integrating innovative technologies to meet the testing needs of next-generation semiconductors, foster growth alongside customers, and strengthen its global market presence. For more information, please visit the Chroma Official Website
Chroma 3680 Advanced SoC Test System |
Chroma 3650-S2 SoC/Analog Test System |
▲Live demonstration of the Chroma 3680 Advanced SoC Test System.
▲Chroma's Semiconductor Test Equipment User Conference attracted nearly 200 industry experts.