Chroma has officially launched a new UIS (Unclamped Inductive Switching) function module for its 3650 series test systems. Specifically designed for avalanche testing, this module is particularly suitable for third-generation semiconductor materials such as Gallium Nitride (GaN) and Silicon Carbide (SiC). The UIS module addresses a long-standing challenge in the industry—obtaining complete and accurate test data and waveform information.

With the rapid development of third-generation semiconductor materials, especially in applications such as electric vehicles and high-efficiency power converters, the demand for accurate testing of advanced components has been increasing. However, existing test equipment has often fallen short in providing the detailed, accurate data required for thorough analysis.

At the core of this new module is a sophisticated high-speed data acquisition ADC architecture. This technology enables the precise capture of minute parameter details throughout the testing process, generating complete waveform data. For semiconductor engineers, this translates to unprecedented insights into transient phenomena and electrical characteristics of components, allowing for more accurate identification of a product's strengths and weaknesses.

Chroma's UIS module stands out in the market with superior accuracy and stability. The module effectively addresses the issue of inductance variation with current, and offers high-resolution waveform capture, enabling engineers to rapidly identify component characteristics and latent defects.

The module is equipped with high-voltage and high-current testing capabilities, as well as a comprehensive set of safety mechanisms such as over-voltage and over-current protection to ensure a secure testing process. The built-in automatic data logging and analysis tools significantly improve testing efficiency for both mass production and engineering analysis. All these features combined result in significantly reduced human error and accelerated time-to-market.

Chroma's UIS module improves the accuracy and efficiency of third-generation semiconductor testing while also improving the safety and reliability of the testing process, providing customers with a competitive edge in the fast-paced semiconductor market.

For decades and counting, Chroma ATE has been committed to driving advancements in semiconductor technology, ensuring our customers stay ahead of the curve through high-performance, reliable test solutions.