Chroma ATE and Innovative Nanotech Showcase Advanced Test Technology at SEMICON WEST 2024
Behind Every PARAMETRIC TEST Breakthrough
Explore our parametric test solutions at SEMICON West 2024. Chroma 3530 Parametric Test System represents a paradigm shift in wafer testing. Each aspect of its design contributes to reducing the cost per wafer, enhancing test quality, and ensuring uncompromised coverage.
For Legacy, Advanced Nodes and Flash Memory
The xMU resourced card provides the capability to test legacy and latest devices eliminating the need for retain legacy testers. The 10MHZ LCR measures gate capacitance even with larger leakage in small nanometer devices. Pulse generator provides +/-40V with tristate for Flash Memory. For the first time in parametric test industry, All Per Pin Resources can fill gap between benchtop and a production system.
Discover How Chroma Simplifies Your Work with 3530 and Hyperion
Join us at booth 5754 to explore the benefits of Chroma 3530 in streamlining your testing process. The cost-effective solution ensures seamless data correlation between benchtop instruments and production parametric testers. Don't miss the chance to learn how our Hyperion Platform can unify your test shell and test cell in the reliability lab across various instruments.
Behind Every NANOPARTICLE MONITORING Breakthrough
Game-Changing Monitoring System for Nanoparticles and Impurities
As the quality demands for semiconductor materials continue to escalate, material inspection and
monitoring become all the more critical. The SuperSizer In-line Nanoparticle Monitoring System
successfully identifies nanoparticles and impurities of liquid chemicals that affect the production yield, helping processing engineers to "see" ultrafine particles in technology nodes below 20 nanometers (nm). The measurement process is completely undisturbed by nanobubbles and accurately measures the size and quantity distribution of particles as small as 3 nm, enabling users to control risks and get a full grasp on yield.
SEMICON West 2024 will be held from July 9-11 at the Moscone Center, San Francisco, CA. Make sure to drop by Chroma's Booth 5754 & 5756 in North Hall to experience the latest breakthroughs in test and measurement technology. We look forward to connecting with you.