【Webinar】Reliability Testing and Burn-in Optimization for Semiconductor Lasers and Optoelectronics

19 Jun 2024

【WEBINAR】

Reliability Testing and Burn-in Optimization for
Semiconductor Lasers and Optoelectronics

July 16, 2024
11:00 AM ET / 10:00 AM CT / 8:00 AM PT / 3:00 PM GMT

In this webinar, you'll learn about the methodology for reliability qualification and optimizing burn-in.

You'll also learn about the range of reliability and burn-in hardware on the market, and newly-available reliability-test-as-a-service options.

This webinar will include live captioning in English, Chinese, and Japanese.

Register Today!

 

Laser reliability has been a key to new product qualification for data communications products, and many other upcoming applications, including powering AI clusters, cloud data centers, and LIDAR for autonomous driving. After starting with a case study, we'll talk about the process of reliability qualification, where the reliability risk usually lies, and potential test platforms. Typical reasons for device failure will also be covered. Then we'll cover the different reliability test hardware on the market for both engineering qualification and high-volume burn-in. Different supported form-factors will be detailed. We'll close with the introduction of new "reliability-test-as-a-service" and outsourced burn-in options, and the chance to ask questions about laser reliability and reliability testing methods. 

Speakers

Dr. Robert W. Herrick 
Consultant 
Robert Herrick Consulting 

John R. Tessitore 
Vice President of Sales and Marketing 
Chroma ATE Inc.

Leo Lu 
Sales Manager 
Testar 

 

Register Today!

 

 

    

Presented by Chroma ATE in collaboration with Laser Focus World.