As the technology of optoelectronic components is maturing, its applications are broadening as well. Take laser diodes for example, they are no longer limited to communication applications but have expanded into consumer products. Photonics test solutions mainly focus on testing optoelectronic components, such as photodiode, LED, EEL, and VCSEL. They can also apply to configurations from upstream to downstream processes, including wafer, laser bar, bare chip, CoS, and TO-CAN. Chroma's system integration technology uniquely combines automation equipment with precision current sources, temperature controllers, and automated optical measurement instruments to perform an array of electrical, optical power, wavelength, near-field and far-field optics, and other optoelectronic characteristic and aging tests.

Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often integrated into production solutions for wafer probe test, burn-in and device or module characterization then reinforced with inspection, metrology, robotics, Industry 4.0 and more.

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HighChannelDensityBurn-inTester Model58604-C
High Channel Density Burn-in Tester
Model 58604-C
  • Use with chamber or oven for burn-in, reliability and life test
  • Auto Current Control (ACC), and Auto Voltage Control (AVC) modes
  • Modular design for easy customization and maintenance
  • Comprehensive ESD protection
  • Independent channels for source and measurement
Burn-InundZuverlässigkeits-PrüfsystemfürLaserdioden Model58604
  • CE Mark
Burn-In und Zuverlässigkeits-Prüfsystem für Laserdioden
Model 58604
  • Geeignet für Burn-in-, Zuverlässigkeits- und Lebensdauerprüfungen
  • ACC- und APC-Steuerungsmodi
  • Individuelle Kanalsteuerung und -messung
  • Antriebsstrom pro Kanal 500 mA und höher
  • Präzise Temperatursteuerung bis 125 °C
  • Einzelmodulbetrieb
HighPowerLaserDiodeBurn-InandReliabilityTestSystem Model58605
High Power Laser Diode Burn-In and Reliability Test System
Model 58605
  • Burn-in, reliability and life test
  • ACC and APC control modes
  • Independent channel for source and measurement
  • Spike-Free sourcing
  • Up to 6000 mA per channel and pulsing
Einbrenn-und-ZuverlässigkeitstestsystemfürPhotodioden Model58606
Einbrenn- und -Zuverlässigkeitstestsystem für Photodioden
Model 58606
  • Einbrenn-, Zuverlässigkeits- und Lebensdauerprüfung
  • Dunkelstrom und Überschlagspannung
  • Bipolargerätequelle mit 256 Kanälen pro Einschub
  • Hohe Bias-Quelle bis 80 Volt
SystemzurCharakterisierungvonLaserdioden Model58620
System zur Charakterisierung von Laserdioden
Model 58620
  • Vollständiges und schlüsselfertiges automatisiertes Prüfgerät für Kantenemitter-Laserdioden
  • Hochpräziser und Träger mit hoher Kapazität, austauschbar mit anderen automatisierten Vorrichtungen