AIServerPowerBBUTesting
AIServerPowerBBUTesting
SafeguardingYourPowerComponentsandIsolatedComponents
SafeguardingYourPowerComponentsandIsolatedComponents
TouchTaiwan2025
TouchTaiwan2025
TaipeiAMPA2025
TaipeiAMPA2025
RevolutionizingSemiconductorMetrologyChroma'sCutting-Edge2D/3DSolutions
RevolutionizingSemiconductorMetrologyChroma'sCutting-Edge2D/3DSolutions

At Chroma
We Advance Excellence

Our leading-edge solutions catalyze breakthroughs across tech industries, setting new benchmarks for quality and reliability. Partner with us in empowering future technologies for a better world.

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Test Solutions

PowerElectronicsTestSolutions
Power Electronics Test Solutions
ServerPowerandBackupBatteryUnit(BBU)TestSolutions
Server Power and Backup Battery Unit (BBU) Test Solutions
ElectricVehicleTestSolutions
Electric Vehicle Test Solutions
BatteryTest&AutomationSolutions
Battery Test & Automation Solutions
EnergyStorageSystem(ESS)andPowerConversionSystem(PCS)TestSolution
Energy Storage System (ESS) and Power Conversion System (PCS) Test Solution
PassiveComponentTestSolutions
Passive Component Test Solutions
ElectricalSafetyTestSolutions
Electrical Safety Test Solutions
Video&ColorTestSolutions
Video & Color Test Solutions
FPD(FlatPanelDisplay)TestSolutions
FPD (Flat Panel Display) Test Solutions
LED&DriverTestSolutions
LED & Driver Test Solutions
PhotonicsTestSolutions
Photonics Test Solutions
AutomatedOpticalInspectionSolutions
Automated Optical Inspection Solutions
Photovoltaic/InverterTest&AutomationSolutions
Photovoltaic / Inverter Test & Automation Solutions
Semiconductor/ICTestSolutions
Semiconductor/IC Test Solutions
RF&WirelessTestSolutions
RF & Wireless Test Solutions
PXITest&MeasurementSolutions
PXI Test & Measurement Solutions
IntelligentManufacturingSystemSolutions
Intelligent Manufacturing System Solutions
TurnkeyTest&AutomationSolutions
Turnkey Test & Automation Solutions
OtherSolution&Services
Other Solution & Services
solution

Newsroom

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27 Feb 2025

Chroma ATE Offers Next-Generation Reliability Test Solutions for SiPh/PIC Manufacturing

As silicon photonics (SiPh) and photonic integrated circuit (PIC) technology continues to evolve, new optoelectronic devices emerge to meet the demand for higher bandwidth, lower power consumption, and reduced latency in high-speed data communication appl

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16 Jan 2025

Chroma ATE Develops Comprehensive Semiconductor Testing Solutions, Strategically Positioning for 2025 Global Market

Semiconductor testing plays a crucial role in the supply chain, with industry players prioritizing factors such as test speed, cost, signal measurement accuracy, one-stop test capabilities, and software support. Chroma ATE holds a key position in the glob

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13 Dec 2024

Chroma ATE Ranked among 2024 Taiwan Top 40 Global Brands

Chroma ATE has for the 6th consecutive year earned a place among the Top 40 Best Taiwan Global Brands. Organized by the Taiwanese Ministry of Economic Affairs' Industrial Development Administration in collaboration with a leading brand valuation firm, thi

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28 Nov 2024

Chroma ATE Recognized as a Top 100 Carbon Competitiveness Company by Business Weekly

Ranks First in Carbon Productivity Growth Rate

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Events

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IRPS2025

IRPS 2025

  • Date: 2025.Mar.30 – 2025.Apr.03
  • Venue: Hyatt Regency Monterey Hotel, Monterey, CA
  • Booth: 1
 OFC/NFOEC2025

OFC/NFOEC 2025

  • Date: 2025.Apr.01 – 2025.Apr.03
  • Venue: The Moscone Center, San Francisco, CA 
  • Booth: 4409

Blog

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BatteryDischargeTestSolution—ReducingTransientInrushCurrent Feature Story

Battery Discharge Test Solution —Reducing Transient Inrush Current

Dec-10-2024
Power Electronics Battery
When performing battery tests, relays are often used to connect batteries and bi-directional DC power supplies. What happens the moment the relay is switched?The Chroma 62180D-600 was used as the experimental equipment for this study.provides an applicati

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SplitPhasePVInverterFrequencyDetection Application Note

Split Phase PV Inverter Frequency Detection

Nov-25-2024
Power Electronics
Meeting IEEE 1547 Frequency Stabilization Requirements Using a Test Fixture

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